Step-Stress Accelerated Life Testing with Type II Censoring and Exponential Distribution for Solar-Powered Lighting Systems

Abstract

This study addresses the reliability assessment of solar-powered lighting systems using a partial step-stress accelerated life testing (ALT) model with Type-II censoring. The research aims to estimate the mean failure time and quantify the acceleration effect due to elevated stress. Secondary data from an experiment involving 31 lighting devices were analyzed. Initially, devices were tested at a normal temperature (293 K) until 16 failures occurred. Subsequently, the stress was increased to 353 K, and testing continued until all units failed or were censored. Under the assumption of an exponential lifetime distribution and a linear accelerated failure-time model, the maximum likelihood estimation (MLE) method was applied for parameter inference. The results show that the estimated mean failure time under normal conditions is approximately 711.6 hours, which reduces to about 38.7 hours under accelerated stress, yielding an acceleration factor of 18.354. Furthermore, a 95% confidence interval for the mean failure time under normal conditions is between 460.2 and 1245 hours. The reliability and percentile life at various stress levels were also derived. This research provides a practical statistical framework for evaluating the reliability of solar-powered lighting devices, offering a more efficient alternative to conventional life testing methods.